Measurement of eye diagrams and constellation diagrams of optical sources using linear optics and waveguide technology

Journal of Lightwave Technology

Volumn 23, Issue 1, 2005, Pages 178-186

  Dorrer, C ^a   Doerr, Christopher Richard ^a   Kang, I ^a   Ryf, Roland ^a   Leuthold, J ^a   Winzer, P J ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

Linear optical sampling; Optical communications; Optical planar waveguide components; Phase measurement; Phase shift keying; Sampling methods

Indexed keywords

LIGHT INTERFERENCE; OPTICAL COMMUNICATION; OPTICAL TESTING; OPTICAL WAVEGUIDES; OPTICS; PHASE MEASUREMENT; PHASE SHIFT KEYING; PHOTODETECTORS; SENSITIVITY ANALYSIS; SIGNAL DETECTION; WAVEFORM ANALYSIS;

LINEAR OPTICAL SAMPLING; LINEAR OPTICS; OPTICAL PLANAR WAVEGUIDE COMPONENTS; OPTIMAL DETECTION; WAVEGUIDE TECHNOLOGY;

LIGHT SOURCES;

EID: 13244298320     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/JLT.2004.840359     Document Type: Article

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