1/f noise versus magnetic field in RuO2 based thick film resistors

Proceedings of the International Spring Seminar on Electronics Technology

Volumn 2003-January, Issue , 2003, Pages 196-201

  Ptak, P ^a   Kolek, A ^a   Zawislak Z ^a   Mleczko, K ^a   Stadler, A W ^a  

^a RZESZOW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Frequency measurement; Glass; Low frequency noise; Magnetic field measurement; Magnetic fields; Magnetic noise; Noise measurement; Resistors; Thick films; Thickness measurement

Indexed keywords

GLASS; MAGNETIC FIELD MEASUREMENT; MAGNETIC THICK FILMS; MAGNETISM; RESISTORS; RUTHENIUM ALLOYS; SPURIOUS SIGNAL NOISE; THICK FILMS; THICKNESS MEASUREMENT;

1/F NOISE; FREQUENCY MEASUREMENTS; LOW-FREQUENCY NOISE; MAGNETIC NOISE; NOISE INTENSITIES; NOISE MEASUREMENTS; THICK FILM RESISTORS;

MAGNETIC FIELDS;

EID: 29244473050     PISSN: 21612528     EISSN: 21612536     Source Type: Conference Proceeding    
DOI: 10.1109/ISSE.2003.1260515     Document Type: Conference Paper

References (19)

1. A. Kolek, P. Ptak, Z. Zawiślak, K. Mleczko, A. W. Stadler: "Low temperature non-linear 1/f noise in RuO2 based thick film resistors", Proc. 25th Int. Spring Seminar on Electronics Technology, ISSE'2002, Prague, pp. 142-146.
2. 2-based cermet resistors", J. Low Temp. Phys., 109, 1997, pp. 461-475.
3. 2-based thick film resistors", J. Low Temp. Phys., 112, 1998, pp. 355-371.
4. N. O. Birge, B. Golding, W. H. Haemmerle: "Electron quantum interference and 1/f noise in bismuth", Phys. Rev. Lett., 62, 1989, pp. 195-198.
5. R. W. Vest: "Conduction mechanisms in thick film microcircuits", Final Technical Report, ARPA Order Number 1642, 1975.
6. J. G. Rhee, T. M. Chen: "Contact noise in thick film resistors", Solid State Technology, Sept. 1978, pp. 59-62.
7. th Int. Conf. On Noise in Physical Systems, Akademiai Kiado, Budapest, Hungary, 1990, pp. 561-564.
8. th Int. Conf. Noise in Physical Systems and 1/f Fluctuations, ICNF 2001, Gainesville, Florida, USA, Oct. 2001, pp. 713-716.
9. J.H. Scofield: "ac method for measuring low-frequency resistance fluctuation spectra", Rev. Sci. Instrum., 58, 1987, pp. 985-993.
10. 2-glass composites", Solid State Ionics, 75, 1995, pp. 211-216.
11. 2 thick film resistors", IEEE Trans, Comp, Hybrids, Manuf. Technol., 14, 1991, pp. 396-406.
12. 2-glass thick-film resistors", J. Am. Ceram. Soc., 78, 1995, pp. 1372-1374.
13. O. Abe, Y. Taketa: "Electrical conduction in thick film resistors", J. Phys. D: Appl. Phys., 24, 1991, pp. 1163-1171.
14. Y.-M. Chiang, L.A. Silverman, R.H. French, and M. Cannon: "Thin glass film between ultrafine conductor particles in thick-film resistors", J. Am. Ceram. Soc., 77, 1985, pp. 1143-1152.
15. G.E. Pike and C.H. Seager: "Electrical properties and conduction mechanisms of Ru-based thick-film (cermet) resistors", J. Appl. Phys., 48, 1977, pp. 5152-5169.
16. M. Prudenziati: "Electrical transport in thick film (cermet) resistors", Electrocomp. Sci. Technol., 10, 1983 pp. 285-293.
17. T. M. Chen, S. F. Su, D. Smith: "1/f noise in Ru-based thick-film resistors", Solid-State Electronics, 25, 1982, pp. 821-827.
18. A. Masoero, A. M. Rietto, B. Morten, M. Prudenziati: "Excess noise and its temperature dependence in thick-film (cermet) resistors", J. Phys. D: Appl. Phys., 16, 1983, pp. 669-674.
19. A. A. Snarskii, A. E. Morozovsky, A. Kolek, A. Kusy: "1/f noise in percolation and percolationlike systems, Phys. Rev. E, 53, 1996, pp. 5596-5065.