Lattice parameter measurement using Le Bail versus structural (Rietveld) refinement: A caution for complex, low symmetry systems

Powder Diffraction

Volumn 20, Issue 1, 2005, Pages 14-17

  Peterson, V K ^a  

^a UNIVERSITY OF TECHNOLOGY SYDNEY   (Australia)

Author keywords

Le Bail; Rietveld; X ray powder diffraction

Indexed keywords

DIFFRACTION INTENSITY; LATTICE PARAMETER MEASUREMENT; LE BAIL; LOW-SYMMETRY SYSTEMS; PATTERN DECOMPOSITION; REFLECTION DENSITY; STRUCTURAL MODELING; SYNCHROTRON DIFFRACTION;

DIFFRACTION; LATTICE CONSTANTS; RIETVELD METHOD; X RAY POWDER DIFFRACTION;

RIETVELD REFINEMENT;

EID: 29244471096     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.1810156     Document Type: Article

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