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Volumn 28, Issue 4, 2005, Pages 771-780
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Correlation of silver migration to the pull out strength of silver wire embedded in an adhesive matrix
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Author keywords
Electronically conductive adhesives (ECAs); Silver migration phenomenon; Tin lead (Sn Pb) solders
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Indexed keywords
ADHESIVES;
BOND STRENGTH (MATERIALS);
ELECTRIC CONDUCTIVITY;
ELECTRIC WIRE;
ENCAPSULATION;
PRINTED CIRCUIT BOARDS;
SCANNING ELECTRON MICROSCOPY;
SILVER;
SOLDERED JOINTS;
SOLDERING ALLOYS;
SURFACE MOUNT TECHNOLOGY;
ELECTRICAL JOINTS;
ELECTRONICALLY CONDUCTIVE ADHESIVES;
PULL OUT STRENGTH;
SILVER MIGRATION;
WIRE BONDING APPLICATIONS;
CONDUCTIVE MATERIALS;
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EID: 29244470286
PISSN: 15213331
EISSN: None
Source Type: Journal
DOI: 10.1109/TCAPT.2005.859752 Document Type: Article |
Times cited : (13)
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References (6)
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