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Volumn 28, Issue 4, 2005, Pages 771-780

Correlation of silver migration to the pull out strength of silver wire embedded in an adhesive matrix

Author keywords

Electronically conductive adhesives (ECAs); Silver migration phenomenon; Tin lead (Sn Pb) solders

Indexed keywords

ADHESIVES; BOND STRENGTH (MATERIALS); ELECTRIC CONDUCTIVITY; ELECTRIC WIRE; ENCAPSULATION; PRINTED CIRCUIT BOARDS; SCANNING ELECTRON MICROSCOPY; SILVER; SOLDERED JOINTS; SOLDERING ALLOYS; SURFACE MOUNT TECHNOLOGY;

EID: 29244470286     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAPT.2005.859752     Document Type: Article
Times cited : (13)

References (6)
  • 1
    • 0029712424 scopus 로고    scopus 로고
    • "Conduction efficiency and strength of electronically conductive adhesive joints"
    • E. Sancaktar, Y. Wei, and M. A. Gaynes, "Conduction efficiency and strength of electronically conductive adhesive joints," J. Adhesion, vol. 56, p. 229. 1996.
    • (1996) J. Adhesion , vol.56 , pp. 229
    • Sancaktar, E.1    Wei, Y.2    Gaynes, M.A.3
  • 5
    • 0035174904 scopus 로고    scopus 로고
    • "Effect of interfacial weight loss by silver migration on the pullout strength of silver wire embedded in an adhesive matrix"
    • E. Sancaktar and A. Khanolkar, "Effect of interfacial weight loss by silver migration on the pullout strength of silver wire embedded in an adhesive matrix," J. Adhesion Sci. Technol., vol. 15, pp. 1221-1245, 2001.
    • (2001) J. Adhesion Sci. Technol. , vol.15 , pp. 1221-1245
    • Sancaktar, E.1    Khanolkar, A.2
  • 6
    • 29244471486 scopus 로고    scopus 로고
    • "Reliability, stress analysis and failure prevention"
    • Computers Information Engineering Conf., CD ROM
    • E. Sancaktar and P. Rajput, "Reliability, stress analysis and failure prevention," in Proc. ASME Int. Design Engineering Technical Conf. Computers Information Engineering Conf., 2003, CD ROM.
    • (2003) Proc. ASME Int. Design Engineering Technical Conf.
    • Sancaktar, E.1    Rajput, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.