A novel method for determination of dielectric properties of materials using a combined embedded modulated scattering and near-field microwave techniques - Part II: Dielectric property recalculation

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 6, 2005, Pages 2398-2401

  Hughes, Dana ^a   Zoughi, Reza ^a  

^a Architectural and Environmental Engineering   (United States)

Author keywords

Dielectric material characterization; Embedded sensors; Microwave nondestructive testing; Modulated scattering technique

Indexed keywords

DIELECTRIC MATERIALS; ELECTROMAGNETIC WAVE SCATTERING; MATHEMATICAL MODELS; MICROWAVES; NONDESTRUCTIVE EXAMINATION; SENSORS; WAVEGUIDES;

DIELECTRIC MATERIAL CHARACTERIZATION; EMBEDDED SENSORS; MICROWAVE NONDESTRUCTIVE TESTING; MODULATED SCATTERING TECHNIQUES;

DIELECTRIC PROPERTIES;

EID: 29244466897     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2005.858133     Document Type: Article

References (4)

1. D. Hughes and R. Zoughi, "A novel method for determination of dielectric properties of materials using a combined embedded modulated scattering and near-field microwave techniques - Part I: Forward model," IEEE Trans. Instrum. Meas., vol. 54, no. 6, Dec. 2005.
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4. K. Bois, L. Handjojo, A. Benally, K. Mubarak, and R. Zoughi, "Dielectric plug-loaded two-port transmission line measurement technique for dielectric property characterization of granular and liquid materials," IEEE Trans. Instrum. Meas., vol. 48, pp. 1141-1148, Dec. 1999.