-
2
-
-
4544353933
-
"The back-end process: Step 4 - Wire bonding step by step"
-
Apr
-
S. Ruegg and D. Truncellito, "The back-end process: Step 4 - Wire bonding step by step," Adv. Packag., p. 73, Apr. 2001.
-
(2001)
Adv. Packag.
, pp. 73
-
-
Ruegg, S.1
Truncellito, D.2
-
3
-
-
0024628148
-
"Direct TEM observation of the welding of asperities between two single-crystal gold films"
-
Mar
-
S.-W. Chan, "Direct TEM observation of the welding of asperities between two single-crystal gold films," IEEE Trans. Compon., Hybrids, Manufact. Technol., vol. 12, no. 1, p. 39, Mar. 1989.
-
(1989)
IEEE Trans. Compon., Hybrids, Manufact. Technol.
, vol.12
, Issue.1
, pp. 39
-
-
Chan, S.-W.1
-
4
-
-
0025392201
-
"A transmission electron microscopy study of ultrasonic wire bonding"
-
Mar
-
J. E. Krzanowski, "A transmission electron microscopy study of ultrasonic wire bonding," IEEE Trans. Compon., Hybrids, Manufact. Technol., vol. 13, no. 1, p. 176, Mar. 1990.
-
(1990)
IEEE Trans. Compon., Hybrids, Manufact. Technol.
, vol.13
, Issue.1
, pp. 176
-
-
Krzanowski, J.E.1
-
5
-
-
0031352975
-
"A microstructural study of dislocation substructures formed in metal foil substrate during ultrasonic wire bonding"
-
N. Murdeshwar and J. E. Krzanowski, "A microstructural study of dislocation substructures formed in metal foil substrate during ultrasonic wire bonding," Metall. Mater. Trans. A, vol. 28A, p. 2663, 1997.
-
(1997)
Metall. Mater. Trans. A
, vol.28 A
, pp. 2663
-
-
Murdeshwar, N.1
Krzanowski, J.E.2
-
6
-
-
0017634595
-
"The ultrasonic welding mechanism as applied to aluminum-and gold-wire bonding in microelectronics"
-
Dec
-
G. G. Harman and J. Albers, "The ultrasonic welding mechanism as applied to aluminum-and gold-wire bonding in microelectronics," IEEE Trans. Parts Hybrids Packag., vol. PHP-13, no. 4, p. 406, Dec. 1977.
-
(1977)
IEEE Trans. Parts Hybrids Packag.
, vol.PHP-13
, Issue.4
, pp. 406
-
-
Harman, G.G.1
Albers, J.2
-
7
-
-
0018007412
-
"Enhancing ultrasonic bond development"
-
Sep
-
V. H. Winchell and H. M. Berg, "Enhancing ultrasonic bond development," IEEE Trans. Comp. Hybrids Manuf. Technol. vol. CHMT-1, no. 3, p. 211, Sep. 1978.
-
(1978)
IEEE Trans. Comp. Hybrids Manuf. Technol.
, vol.CHMT-1
, Issue.3
, pp. 211
-
-
Winchell, V.H.1
Berg, H.M.2
-
8
-
-
0015200210
-
"The formation of ultrasonic bonds between metals"
-
K. C. Joshi, "The formation of ultrasonic bonds between metals," Weld. J., vol. 50, p. 840, 1971.
-
(1971)
Weld. J.
, vol.50
, pp. 840
-
-
Joshi, K.C.1
-
9
-
-
0003158611
-
"An experimental model of the microelectronic ultrasonic wire bonding mechanism"
-
Las Vegas, NV, Apr. 5-7
-
G. G. Harman and K. O. Leedy, "An experimental model of the microelectronic ultrasonic wire bonding mechanism," in Proc. 10th Annu. Reliability Physics Conf., Las Vegas, NV, Apr. 5-7, 1972, pp. 49-56.
-
(1972)
Proc. 10th Annu. Reliability Physics Conf.
, pp. 49-56
-
-
Harman, G.G.1
Leedy, K.O.2
-
10
-
-
0013014770
-
"Numerical study of wire bonding analysis of interfacial deformation between wide and pad"
-
Y. Takahashi and M. Inoue, "Numerical study of wire bonding analysis of interfacial deformation between wide and pad," J. Electron. Packag., vol. 14, p. 27, 2002.
-
(2002)
J. Electron. Packag.
, vol.14
, pp. 27
-
-
Takahashi, Y.1
Inoue, M.2
-
11
-
-
0033701561
-
"Integrated temperature microsensors for characterization and optimization of thermosonic ball bonding process"
-
Jun
-
M. Mayer, O. Paul, D. Bolliger, and H. Baltes, "Integrated temperature microsensors for characterization and optimization of thermosonic ball bonding process," IEEE Trans. Compon. Packag. Technol., vol. 23, no. 2, p. 393, Jun. 2000.
-
(2000)
IEEE Trans. Compon. Packag. Technol.
, vol.23
, Issue.2
, pp. 393
-
-
Mayer, M.1
Paul, O.2
Bolliger, D.3
Baltes, H.4
-
12
-
-
0011002139
-
"Analytical methods to characterize the interconnection quality and gold ball bonds"
-
Essen, Germany, Jan. 31-Feb. 2
-
A. Carrass and V. P. Jaecklin, "Analytical methods to characterize the interconnection quality and gold ball bonds," in Proc. EuPac'96, Essen, Germany, Jan. 31-Feb. 2 1996, p. 135.
-
(1996)
Proc. EuPac'96
, pp. 135
-
-
Carrass, A.1
Jaecklin, V.P.2
-
13
-
-
29244447327
-
"Increasing bond quality by ultrasonic vibration monitoring"
-
F. Osterward, K.-D. Lang, and H. Reichl, "Increasing bond quality by ultrasonic vibration monitoring," in Proc. ISHM'96, 1996, p. 426.
-
(1996)
Proc. ISHM'96
, pp. 426
-
-
Osterward, F.1
Lang, K.-D.2
Reichl, H.3
-
14
-
-
85040875608
-
-
London, U.K.: Cambridge University Press
-
K. L. Johnson, Contact Mechanics, London, U.K.: Cambridge University Press, 1985.
-
(1985)
Contact Mechanics
-
-
Johnson, K.L.1
-
15
-
-
84882729036
-
"Compliance of elastic bodies in contact"
-
R. D. Mindlin, "Compliance of elastic bodies in contact," Trans. ASME, Series E, J. Appl. Mech., vol. 16, p. 259, 1949.
-
(1949)
Trans. ASME, Series E, J. Appl. Mech.
, vol.16
, pp. 259
-
-
Mindlin, R.D.1
-
16
-
-
14844289332
-
"The role of micro-slip in ultrasonic bonding of microelectronic dimensions"
-
Washington D.C., Oct. 30-31
-
G. K. C. Chen, "The role of micro-slip in ultrasonic bonding of microelectronic dimensions," in Proc. Int. Microelectronic Symp., Washington D.C., Oct. 30-31, 1972, pp. 5-A-l-l-5-A-1-9.
-
(1972)
Proc. Int. Microelectronic Symp.
-
-
Chen, G.K.C.1
-
17
-
-
0001241656
-
"Self-propagating room-temperature silicon wafer bonding in ultra high vacuum"
-
U. GÖsele, H. Stenzel, T. Martini, J. Steinkirchner, D. Conrad, and K. Scheerschmidt, "Self-propagating room-temperature silicon wafer bonding in ultra high vacuum," Appl. Phys. Lett., vol. 67, p. 3614, 1995.
-
(1995)
Appl. Phys. Lett.
, vol.67
, pp. 3614
-
-
GÖsele, U.1
Stenzel, H.2
Martini, T.3
Steinkirchner, J.4
Conrad, D.5
Scheerschmidt, K.6
-
18
-
-
0036695344
-
"Effects of Au plating on small-scale resistance spot welding of thin sheet nickel"
-
W. Tan, Y. Zhou, and H. W. Kerr, "Effects of Au plating on small-scale resistance spot welding of thin sheet nickel," Metall. Mater. Trans. A, vol. 33A, p. 2667, 2002.
-
(2002)
Metall. Mater. Trans. A
, vol.33 A
, pp. 2667
-
-
Tan, W.1
Zhou, Y.2
Kerr, H.W.3
-
19
-
-
84996233123
-
"Fundamentals of solid-phase welding"
-
D. R. Milner and G. W. Rowe, "Fundamentals of solid-phase welding," Metallurg. Rev., vol. 7, p. 433, 1962.
-
(1962)
Metallurg. Rev.
, vol.7
, pp. 433
-
-
Milner, D.R.1
Rowe, G.W.2
-
20
-
-
0016557837
-
"Mechanism of solid state pressure welding"
-
H. A. Mohamed and J. Washburn, "Mechanism of solid state pressure welding," Weld. J., vol. 9, p. 302-s, 1975.
-
(1975)
Weld. J.
, vol.9
-
-
Mohamed, H.A.1
Washburn, J.2
-
21
-
-
4344574366
-
"Influence of relative interfaial movement and friction-restraint in cold pressure welding"
-
E. Homers,. "Influence of relative interfaial movement and friction-restraint in cold pressure welding," British Weld. J., vol. 6, p. 29, 1959.
-
(1959)
British Weld. J.
, vol.6
, pp. 29
-
-
Homers, E.1
-
22
-
-
0016557114
-
"Effect of surface contamination on the thermocompression bondability of gold"
-
Sep
-
J. L. Jellison, "Effect of surface contamination on the thermocompression bondability of gold," IEEE Trans. Parts, Hybrids, Packag., vol. PHP-11, no. 3, p. 206, Sep. 1975.
-
(1975)
IEEE Trans. Parts, Hybrids, Packag.
, vol.PHP-11
, Issue.3
, pp. 206
-
-
Jellison, J.L.1
-
23
-
-
0003503829
-
"Microelectronic bonding process monitoring by integrated sensors"
-
Ph.D. dissertation, Swiss Federal Inst. Technol. (ETH) Zurich, Switzerland
-
M. Mayer, "Microelectronic bonding process monitoring by integrated sensors," Ph.D. dissertation, Swiss Federal Inst. Technol. (ETH) Zurich, Switzerland, 2002.
-
(2002)
-
-
Mayer, M.1
|