New configuration of channeled spectropolarimeter for snapshot polarimetric measurement of materials

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5878, Issue , 2005, Pages 1-8

  Okabe, Hiroshi ^a   Matoba, Kenichi ^a   Hayakawa, Masayuki ^a   Taniguchi, Atsushi ^b   Oka, Kazuhiko ^b   Naito, Hitoshi ^a   Nakatsuka, Nobuo ^a  

^a OMRON CORPORATION   (Japan)

^b HOKKAIDO UNIVERSITY   (Japan)

Author keywords

Channeled spectropolarimeter; Channeled spectroscopic ellipsometry; Channeled spectrum; Multiple order retarder; Snapshot; Spectroscopic ellipsometer

Indexed keywords

ELECTROOPTICAL EFFECTS; LIGHT MODULATORS; LIGHT POLARIZATION; LIGHT SOURCES;

CHANNELED SPECTROPOLARIMETER; CHANNELED SPECTROSCOPIC ELLIPSOMETER (CSE); MULTIPLE-ORDER RETARDER; SNAPSHOT;

POLARIMETERS;

EID: 29244450207     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.616298     Document Type: Conference Paper

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