Singleshot spectroscopic polarimetry using channeled spectrum

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4919, Issue , 2002, Pages 167-175

  Oka, Kazuhiko ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

Channeled spectrum; Ellipsometry; Spectroscopic polarimetry; Thin film; White light interferometry

Indexed keywords

ELLIPSOMETRY; INTERFEROMETRY; POLARIZATION; REMOTE SENSING; SPECTROSCOPIC ANALYSIS; THIN FILMS;

CHANNELED SPECTROPOLARIMETRY; CHANNELED SPECTRUM; SPECTROSCOPIC POLARIMETRY; STATE OF POLARIZATION;

POLARIMETERS;

EID: 0036442571     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.465756     Document Type: Conference Paper

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