Profilometry using optical microwaves with different carrier frequencies and two-photon absorption process of photodetector

IEEE Photonics Technology Letters

Volumn 17, Issue 12, 2005, Pages 2682-2684

  Tanaka, Yosuke ^a   Sako, Naoya ^a   Imoto, Soichiro ^a   Kurokawa, Takashi ^a  

^a TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY   (Japan)

Author keywords

Optical variables measurement; Profilometry; Two photon absorption

Indexed keywords

BANDPASS FILTERS; BANDWIDTH; DEMULTIPLEXING; FIBER LASERS; FIBER OPTICS; LIGHT ABSORPTION; LIGHT POLARIZATION; MICROWAVES; OPTICAL VARIABLES MEASUREMENT; PHOTOCURRENTS; PHOTONS; PROFILOMETRY;

OPTICAL MICROWAVES; TWO-PHOTON ABSORPTION;

PHOTODETECTORS;

EID: 29244441665     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2005.859120     Document Type: Article

References (2)

1. Y. Tanaka, N. Sako, T. Kurokawa, H. Tsuda, and M. Takeda, "Profilometry based on two-photon absorption in a silicon avalanche photodiode," Opt. Lett., vol. 28, no. 6, pp. 402-404, 2003.
2. M. Takeda and H. Yamamoto, "Fourier-transform speckle profilometry: Three-dimensional shape measurements of diffuse objects with large height steps and/or spatially isolated surfaces," Appl. Opt., vol. 33, pp. 7829-7837, 1994.