Profilometry based on two-photon absorption in a silicon avalanche photodiode

Optics Letters

Volumn 28, Issue 6, 2003, Pages 402-404

  Tanaka, Yosuke ^a   Sako, Naoya ^a   Kurokawa, Takashi ^a   Tsuda, Hiroyuki ^b   Takeda, Mitsuo ^c  

^a TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY   (Japan)

^b KEIO UNIVERSITY   (Japan)

^c UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHE DIODES; FIBER OPTICS; INTERFEROMETERS; PHOTODIODES; PHOTONS; SEMICONDUCTING SILICON;

TWO-PHOTON ABSORPTION;

LIGHT ABSORPTION;

EID: 0038613498     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.28.000402     Document Type: Article

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