Electrical conduction on various Au/Si(111) surface superstructures

e-Journal of Surface Science and Nanotechnology

Volumn 3, Issue , 2005, Pages 497-502

  Yamazaki, Shiro ^a   Matsuda, Iwao ^a   Okino, Hiroyuki ^a   Morikawa, Harumo ^a   Hasegawa, Shuji ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Four point probe conductivity measurement; Gold; Reflection high energy electron diffraction (RHEED); Scanning Tunneling Microscopy; Silicon; Surface electrical transport; Surface relaxation and reconstruction

Indexed keywords

BAND STRUCTURE; CRYSTAL ORIENTATION; ELECTRIC CONDUCTIVITY; HEAT TREATMENT;

FOUR-POINT PROBE CONDUCTIVITY MEASUREMENT; SURFACE ELECTRICAL TRANSPORT; SURFACE RELAXATION AND RECONSTRUCTION;

SURFACE CHEMISTRY;

EID: 29144528775     PISSN: 13480391     EISSN: 13480391     Source Type: Journal    
DOI: 10.1380/ejssnt.2005.497     Document Type: Conference Paper

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