Au induced reconstructions on Si(1 1 1)

Surface Science

Volumn 488, Issue 1-2, 2001, Pages 233-238

  Seifert, C ^a   Hild, R ^a   Horn Von Hoegen, M ^a   Zhachuk, R A ^b   Olshanetsky, B Z ^b  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

^b INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

Author keywords

Gold; Low energy electron diffraction (LEED); Low index single crystal surfaces; Scanning tunneling microscopy; Silicon; Surface relaxation and reconstruction; Surface structure, morphology, roughness, and topography

Indexed keywords

ADSORPTION; CRYSTAL ATOMIC STRUCTURE; GOLD; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; RELAXATION PROCESSES; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; SURFACE PHENOMENA; SURFACE ROUGHNESS; SURFACE TREATMENT;

LOW INDEX SINGLE CRYSTALS; SURFACE RECONSTRUCTION;

SILICON;

EID: 0035426174     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01139-6     Document Type: Article

References (21)