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Volumn 66, Issue 11, 2005, Pages 2000-2003

Characterization of Cu(In,Ga)Se2 thin films prepared by evaporationfrom ternary compounds

Author keywords

A. Semiconductors; A. Thin films; C. X ray diffraction; D. Crystal structure

Indexed keywords

CHARACTERIZATION; COPPER COMPOUNDS; CRYSTAL STRUCTURE; EVAPORATION; SEMICONDUCTOR MATERIALS; X RAY DIFFRACTION ANALYSIS;

EID: 29144502433     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2005.09.073     Document Type: Conference Paper
Times cited : (13)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.