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Volumn 66, Issue 11, 2005, Pages 2000-2003
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Characterization of Cu(In,Ga)Se2 thin films prepared by evaporationfrom ternary compounds
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Author keywords
A. Semiconductors; A. Thin films; C. X ray diffraction; D. Crystal structure
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Indexed keywords
CHARACTERIZATION;
COPPER COMPOUNDS;
CRYSTAL STRUCTURE;
EVAPORATION;
SEMICONDUCTOR MATERIALS;
X RAY DIFFRACTION ANALYSIS;
A. SEMICONDUCTORS;
A. THIN FILMS;
C. X-RAY DIFFRACTION;
D. CRYSTAL STRUCTURE;
THIN FILMS;
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EID: 29144502433
PISSN: 00223697
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jpcs.2005.09.073 Document Type: Conference Paper |
Times cited : (13)
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References (13)
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