Radiation hardness assurance and reliability testing of InGaAs photodiodes for optical control links for the CMS experiment

IEEE Transactions on Nuclear Science

Volumn 52, Issue 5 II, 2005, Pages 1480-1487

  Gill, K ^a   Axer, M ^a   Dris, S ^a,b   Grabit, R ^a   Macias, R ^a,c   Noah, E ^a   Troska, J ^a   Vasey, F ^a  

^a CERN   (Switzerland)

^b IMPERIAL COLLEGE LONDON   (United Kingdom)

^c UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

CMS optical links; Photodiodes; Radiation hardness assurance; Reliability

Indexed keywords

OPTICAL LINKS; RADIATION DAMAGE; RADIATION HARDENING; RELIABILITY;

CMS OPTICAL LINKS; RADIATION HARDNESS ASSURANCE;

PHOTODIODES;

EID: 29144474506     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2005.855811     Document Type: Conference Paper

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