Spectroellipsometric approach to determine linear electro-optic coefficient of c -axis-oriented LiNb O3 thin films

Journal of Applied Physics

Volumn 98, Issue 11, 2005, Pages

  Akazawa, Housei ^a   Shimada, Masaru ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL PARAMETERS; POCKELS COEFFICIENT; WAVELENGTH;

ELECTROMAGNETIC DISPERSION; ELECTROOPTICAL EFFECTS; ELLIPSOMETRY; PERTURBATION TECHNIQUES; SILICON; SPECTROSCOPIC ANALYSIS; SUBSTRATES; THIN FILMS; WAVEGUIDE COMPONENTS;

LITHIUM NIOBATE;

EID: 29144441134     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2134889     Document Type: Article

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