Performance of an imaging system based on silicon pixel detectors of different thickness

IEEE Transactions on Nuclear Science

Volumn 52, Issue 5 III, 2005, Pages 1989-1993

  Bisogni, M G ^a   Boscardin, M ^b   Bulajic, D ^a,c   Dalla Betta, G F ^d   Delogu, P ^a   Fantacci, M E ^a   Novelli, M ^a   Piemonte, C ^b   Quattrocchi, M ^a   Rosso, V ^a   Stefanini, A ^a   Zorzi, N ^b  

^a UNIVERSITY OF PISA   (Italy)

^b ITC IRST   (Italy)

^c ABDUS SALAM INTERNATIONAL CENTRE FOR THEORETICAL PHYSICS   (Italy)

^d UNIVERSITY OF TRENTO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING SYSTEMS; OPTIMIZATION; PHOTONS; SPECTROSCOPIC ANALYSIS;

CHARGE DIFFUSION; DETECTION EFFICIENCY; IMAGING CAPABILITIES;

RADIATION DETECTORS;

EID: 29144436365     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2005.856820     Document Type: Article

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