Characterization of Si pixel detectors of different thickness

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 518, Issue 1-2, 2004, Pages 418-420

  Bisogni, M G ^a   Boscardin, M ^b   Dalla Betta, G F ^b,c   Delogu, P ^a   Fantacci, M E ^a   Gregori, P ^b   Linsalata, S ^a   Novelli, M ^a   Piemonte, C ^b   Quattrocchi, M ^a   Rosso, V ^a   Stefanini, A ^a   Zorzi, N ^b   Zucca, S ^a  

^a UNIVERSITY OF PISA   (Italy)

^b ITC IRST   (Italy)

^c UNIVERSITY OF TRENTO   (Italy)

Author keywords

Digital mammography; Silicon pixel detectors; Single photon counting electronics

Indexed keywords

COMPUTER AIDED DIAGNOSIS; COMPUTER SIMULATION; ELECTRIC BREAKDOWN; IMAGING SYSTEMS; LEAKAGE CURRENTS; MAMMOGRAPHY; PHOTONS; VLSI CIRCUITS;

DIGITAL MAMMOGRAPHY; SILICON PIXEL DETECTORS; SINGLE PHOTON COUNTING ELECTRONICS;

RADIATION DETECTORS;

EID: 0942288157     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2003.11.045     Document Type: Conference Paper

References (5)

1. Bisogni M.G., et al. Proc. SPIE. 3445:1998;298.
2. http://medipix.web.cern.ch/MEDIPIX.
3. Novelli M., et al. Nucl. Instr. and Meth. A. 509:2003;283.
4. Bencivelli W., et al. Nucl. Instr. and Meth. A. 310:1991;210.
5. Amendolia S.R., et al. IEEE Trans. Nucl. Sci. 49(5):2002;2361.