Influence of attractive force on imaging micro-droplets of water by atomic force microscope

Surface and Interface Analysis

Volumn 37, Issue 12, 2005, Pages 1105-1110

  Wang, Rongguang ^a   Kido, Mitsuo ^a  

^a HIROSHIMA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Atomic force microscope (AFM); Attractive force; Image analysis; Micro droplets of water; Operation point; Surface

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; DROP FORMATION; IMAGE ANALYSIS; SURFACE STRUCTURE; WATER ANALYSIS;

ATTRACTIVE FORCE; MICRO-DROPLETS OF WATER; OPERATION POINT;

IMAGING SYSTEMS;

EID: 29044436564     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.2085     Document Type: Article

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