SCOPUS 정보 검색 플랫폼

Volumn 49, Issue 11, 2000, Pages 641-648

Corrosion damages of resin encapsulated semiconductor devices and its preventions

b NONE

Author keywords

[No Author keywords available]

Indexed keywords

CORROSION PREVENTION; DELAMINATION; INTERFACES (MATERIALS); LSI CIRCUITS; RESINS; SEMICONDUCTING LEAD COMPOUNDS; SEMICONDUCTOR DEVICE TESTING;

CORROSION DAMAGES; RESIN ENCAPSULATED SEMICONDUCTOR DEVICES;

CORROSIVE EFFECTS;

EID: 0034319896 PISSN: 09170480 EISSN: None Source Type: Journal
DOI: 10.3323/jcorr1991.49.641 Document Type: Article

Times cited : (13)

References (14)

2
- 0342467361
- J.D. Sinclair : J. Electrochem. Soc., 13, 589 (1988).
- (1988) J. Electrochem. Soc. , vol.13 , pp. 589
- Sinclair, J.D.¹

6
- 85004204746
- (T. Ozaki and Y. Ishikawa) : [Zairyo-to-Kankyo (Corros. Eng.)], 40, 57 (1991).
- (1991) Zairyo-to-Kankyo (Corros. Eng.) , vol.40 , pp. 57
- Ozaki, T.¹ Ishikawa, Y.²

7
- 0004233350
- Interscience
- D.W. Rice, R.J. Cappell, P.B.P. Phipps and P. Peterson : Atmospheric Corrosion, Interscience, p. 651 (1982).
- (1982) Atmospheric Corrosion , pp. 651
- Rice, D.W.¹ Cappell, R.J.² Phipps, P.B.P.³ Peterson, P.⁴

10
- 0017942692
- W. Funke & H. Haagen : Ind., Eng. Chem. Prod. Res. Dev. 17, 50 (1978).
- (1978) Ind., Eng. Chem. Prod. Res. Dev. , vol.17 , pp. 50
- Funke, W.¹ Haagen, H.²

11
- 0038412163
- JSCE
- (T. Ozaki, T. Hatsuda and Y. Ishikawa) : (Proc. JSCE Materials and Environments 1987), p.147, (JSCE) (1987).
- (1987) Proc. JSCE Materials and Environments 1987 , pp. 147
- Ozaki, T.¹ Hatsuda, T.² Ishikawa, Y.³

14
- 0343336672
- JSCE
- (T. Ozaki, T. Hattori and Y. Ishikawa) : (Proc. 36 th Japan Conf. Materials and Environments), p.501, (JSCE) (1989).
- (1989) Proc. 36 th Japan Conf. Materials and Environments , pp. 501
- Ozaki, T.¹ Hattori, T.² Ishikawa, Y.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.