Examination of the bonding in binary transition-metal monophosphides MP (M = Cr, Mn, Fe, Co) by X-ray photoelectron spectroscopy

Inorganic Chemistry

Volumn 44, Issue 24, 2005, Pages 8988-8998

  Grosvenor, Andrew P ^a   Wik, Stephen D ^a   Cavell, Ronald G ^a   Mar, Arthur ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 28944449324     PISSN: 00201669     EISSN: None     Source Type: Journal    
DOI: 10.1021/ic051004d     Document Type: Article

References (47)

1. Aronsson, B.; Lundström, T.; Rundqvist, S. Borides, Silicides and Phosphides; Methuen: London, 1965.
2. Hulliger, F. Struct. Bonding 1968, 4, 83-229.
3. Huber, E. E., Jr.; Ridgley, D. H. Phys. Rev. Sect. A 1964, 135, 1033-1040.
4. Okabayashi, J.; Tanaka, K.; Hashimoto, M.; Fujimori, A.; Ono, K.; Okusawa, M.; Komatsubara, T. Phys. Rev. B: Condens. Matter Mater. Phys. 2004, 69, 132411-1-132411-4.
5. Perera, S. C.; Tsoi, G.; Wenger, L. E.; Brock, S. L. J. Am. Chem. Soc. 2003, 125, 13960-13961.
6. Perera, S. C.; Fodor, P. S.; Tsoi, G. M.; Wenger, L. E.; Brock, S. L. Chem. Mater. 2003, 15, 4034-4038.
7. Oyama, S. T. J. Catal. 2003, 216, 343-352.
8. Rundqvist, S. Acta Chem. Scand. 1962, 16, 287-292.
9. Rundqvist, S.; Nawapong, P. C. Acta Chem. Scand. 1965, 19, 1006-1008.
10. Pearson, W. B. The Crystal Chemistry and Physics of Metals and Alloys; Wiley-Interscience: New York, 1972.
11. Yanase, A.; Hasegawa, A. J. Phys. C: Solid State Phys. 1980, 13, 1989-1993.
12. Perkins, P. G.; Marwaha, A. K.; Stewart, J. J. P. Theor. Chim. Acta 1981, 59, 569-583.
13. Tremel, W.; Hoffmann, R.; Silvestre, J. J. Am. Chem. Soc. 1986, 108, 5174-5187.
14. Pauling, L. The Nature of the Chemical Bond, 3rd ed.; Cornell University Press: Ithaca, NY, 1960.
15. Domashevskaya, E. P.; Terekhov, V. A.; Ugai, Ya. A.; Nefedov, V. I.; Sergushin, N. P.; Firsov, M. N. J. Electron Spectrosc. Relat. Phenom. 1979, 16, 441-453.
16. Myers, C. E.; Franzen, H. F.; Anderegg, J. W. Inorg. Chem. 1985, 24, 1822-1824.
17. Okuda, H.; Senba, S.; Sato, H.; Shimada, K.; Namatame, H.; Taniguchi, M. J. Electron Spectrosc. Relat. Phenom. 1999, 101-103, 657-660.
18. Shabanova, I. N.; Mitrochin, Y. S.; Terebova, N. S.; Nebogatikov, N. M. Surf. Interface Anal. 2002, 34, 606-609.
19. Noläng, B.; Eriksson, O.; Johansson, B. J. Phys. Chem. Solids 1990, 51, 1033-1046.
20. Scott, B. A.; Eulenberger, G. R.; Bernheim, R. A. J. Chem. Phys. 1968, 48, 263-272.
21. Fairley, N. CasaXPS, version 2.2.19; Casa Software Ltd.: Teighnmouth, Devon, UK, 2003 (www.casaxps.com).
22. Whangbo, M.-H.; Hoffmann, R. J. Am. Chem. Soc. 1978, 100, 6093-6098.
23. Hoffmann, R. Solids and Surfaces: A Chemist's View of Bonding in Extended Structures; VCH Publishers: New York, 1988.
24. Briggs, D., Seah, M. P., Eds. Practical Surface Analysis, Vol. I: Auger and X-ray Photoelectron Spectroscopy, 2nd ed.; Wiley: Chichester, 1990.
25. Allred, A. L.; Rochow, E. G. J. Inorg. Nucl. Chem. 1958, 5, 264-268.
26. Tong, G. S. M.; Jeung, G. H.; Cheung, A. S.-C. J. Chem. Phys. 2003, 118, 9224-9232.
27. Wagner, C. D.; Naumkin, A. V.; Kraut-Vass, A.; Allison, J. W.; Powell, C. J.; Rumble, J. R., Jr. NIST X-ray Photoelectron Spectroscopy Database, version 3.4 (web version); National Institute of Standards and Technology: Gaithersburg, MD, 2003 (srdata.nist.gov/xps).
28. Doniach, S.; Šunjić, M. J. Phys. C: Solid State Phys. 1970, 3, 285-291.
29. Hüfner, S. In Photoemission in Solids II; Ley, L., Cardona, M., Eds.; Springer-Verlag: Berlin, 1979.
30. Raaen, S. Solid State Commun. 1986, 60, 991-993.
31. Richardson, D.; Hisscott, L. A. J. Phys. F: Metal Phys. 1976, 6, L127-L134.
32. Anno, H.; Matsubara, K.; Caillat, T.; Fleurial, J.-P. Phys. Rev. B: Condens. Matter Mater. Phys. 2000, 62, 10737-10743.
33. Hüfner, S. Photoelectron Spectroscopy, Springer-Verlag: Berlin, 1995.
34. Kemeny, P. C.; Shevchik, N. J. Solid State Commun. 1975, 17, 255-258.
35. Hüfner, S.; Wertheim, G. K. Phys. Lett. A 1975, 51, 299-300.
36. Egerton, R. F.; Malac, M. J. Electron Spectrosc. Relat. Phenom. 2005, 143, 43-50.
37. Kotani, A.; Toyozawa, T. J. Phys. Soc. Jpn. 1974, 37, 912-919.
38. Robins, J. L.; Swan, J. B. Proc. Phys. Soc., London 1960, 76, 857-869.
39. Misell, D. L.; Atkins, A. J. J. Phys. C: Solid State Phys. 1972, 5, 95-106.
40. Grosvenor, A. P.; Biesinger, M. C.; Zou, F.; Smart, R. St-C.; McIntyre, N. S. Surf. Sci. 2005, submitted.
41. Gorodetsky, D. A.; Melnik, Yu. P.; Proskurin, D. P.; Sklyar, V. K.; Usenko, V. A.; Yas'ko, A. A. Surf. Sci. 1998, 416, 255-263.
42. Liang, K. S.; Chen, T. Solid State Commun. 1977, 23, 975-978.
43. Scofield, J. H. J. Electron Spectrosc. Relat. Phenom. 1976, 8, 129-137.
44. Kanama, D.; Oyama, S. T.; Otani, S.; Cox, D. F. Surf. Sci. 2004, 532, 8-16.
45. Watts, J. F.; Wolstenholme, J. An Introduction to Surface Analysis by XPS and AES; Wiley: Rexdale, 2003.
46. Brillson, L. J.; Ceasar, G. P. Surf. Sci. 1976, 55, 457-468.
47. Tougaard, S. QUASES-IMFP-TPP2M: Database for Calculation of IMFPs by TPP2M Formula, version 2.1; QUASES-Tougaard, Inc.: Odense, Denmark, 2000 (www.quases.com).