Feature Extraction Using Supervised Independent Component Analysis by Maximizing Class Distance

IEEJ Transactions on Electronics, Information and Systems

Volumn 124, Issue 1, 2004, Pages 157-163

  Sakaguchi, Yoshinori ^a   Ozawa, Seiichi ^a   Kotani, Manabu ^a  

^a KOBE UNIVERSITY   (Japan)

Author keywords

feature extraction; independent component analysis; pattern recognition; supervised learning

Indexed keywords

EID: 28844501055     PISSN: 03854221     EISSN: 13488155     Source Type: Journal    
DOI: 10.1541/ieejeiss.124.157     Document Type: Article

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