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Volumn 863, Issue , 2005, Pages 35-40

Solid state MAS NMR spectroscopic characterization of plasma damage and UV modification of low k dielectric films

Author keywords

[No Author keywords available]

Indexed keywords

CROSSLINKING; DIELECTRIC FILMS; ELASTIC MODULI; FOURIER TRANSFORM INFRARED SPECTROSCOPY; NUCLEAR MAGNETIC RESONANCE; ULTRAVIOLET RADIATION;

EID: 28844496364     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-863-b1.8     Document Type: Conference Paper
Times cited : (2)

References (8)
  • 1
    • 0029547914 scopus 로고
    • IEEE Electron Devices Society, Washington D.C. USA, December 10-13
    • M.Bohr, Tech. Dig., Int. Electron Devices Meet., IEEE Electron Devices Society, Washington D.C. USA, 1995, p.241, December 10-13.
    • (1995) Tech. Dig., Int. Electron Devices Meet. , pp. 241
    • Bohr, M.1
  • 7
    • 28844436257 scopus 로고    scopus 로고
    • to be published San Francisco, CA, Mater.Res.Soc.Proc. tbd, Pittsburgh, PA
    • F.Iacopi, et al., to be published Proceedings of the 2005 MRS Spring Meeting, San Francisco, CA, (Mater.Res.Soc.Proc. tbd, Pittsburgh, PA, 2005) B3.9
    • (2005) Proceedings of the 2005 MRS Spring Meeting
    • Iacopi, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.