Optimisation of Low Coherence Speckle Interferometry (LCSI) for characterisation of multi-layered materials

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5858, Issue , 2005, Pages 1-12

  Gastinger, Kay ^a   Winther, Svein ^a  

^a SINTEF ICT   (Norway)

Author keywords

Low Coherence Speckle Interferometry (LCSI); Low coherence interferometry; Microscopic Electronic Speckle Pattern Interferometry (ESPI); Microscopic Optical Coherence Tomography (OCT)

Indexed keywords

COHERENT LIGHT; INTERFACES (MATERIALS); OPTICAL MULTILAYERS; OPTICAL PROPERTIES; PARAMETER ESTIMATION; POLYMERS; SIGNAL INTERFERENCE; SPECKLE;

LOW COHERENCE SPECKLE INTERFEROMETRY (LCSI); LOW-COHERENCE INTERFEROMETRY; MICROSCOPIC ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI); MICROSCOPIC OPTICAL COHERENCE TOMOGRAPHY (OCT);

INTERFEROMETRY;

EID: 28844495425     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.613170     Document Type: Conference Paper

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