Microscopic ESPI: Better fringe quality by the Fourier transform method

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4933, Issue , 2003, Pages 335-341

  El Jarad, Akram ^a   Gülker, Gerd ^a   Hinsch, Klaus D ^a  

^a UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

ESPI; Fourier transform method; Microscope; Spatial phase shift

Indexed keywords

DEFORMATION; FOURIER TRANSFORMS; PHASE SHIFT; SPECKLE;

FRINGE QUALITY;

INTERFEROMETRY;

EID: 0242469108     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.516662     Document Type: Conference Paper

References (11)

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