Measurements of material refractive index with a circular heterodyne interferometer

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5856 PART II, Issue , 2005, Pages 882-892

  Jian, Zhi Cheng ^a   Lin, Jiun You ^b   Hsieh, Po Jen ^a   Su, Der Chin ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

Author keywords

Birefringent crystal; Circular heterodyne interferometer; Fresnel equations; Isotropic material; Refractive index

Indexed keywords

BIREFRINGENCE; CRYSTALS; DATA REDUCTION; HETERODYNING; INTERFEROMETERS; LIGHT REFLECTION; REFRACTIVE INDEX;

BIREFRINGENT CRYSTALS; CIRCULAR HETERODYNE INTERFEROMETERS; FRESNEL EQUATIONS; ISOTROPIC MATERIALS;

OPTICAL VARIABLES MEASUREMENT;

EID: 28844493650     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.612480     Document Type: Conference Paper

References (20)

1. X. Wang and J. Yao, "Transmitted and tuning characteristics of birefringent filters," Appl. Opt. 31, 4505-4508 (1992).
2. J. F. Valley, J.W. Wu, and C. L. Valencia, "Heterodyne measurement of poling transient effects in electro-optic polymer thin films," Appl. Phys. Lett. 57, 1084-1086 (1990).
3. I. Moreno, J. A. Davis, K. G. D'Nelly, and D. B. Allison, "Transmission and phase measurement for polarization eigenvectors in twisted-nematic liquid crystal spatial light modulators," Opt. Eng. 37, 3048-3052 (1998).
4. R. S. Weis and T. K. Gaylord, "Magnetooptic multilayered memory structure with a birefringent superstrate: a rigorous analysis," Appl. Opt. 28, 1926-1930 (1989).
5. W. R. Hunter, "Optical constant of metals in the extreme ultraviolet I. A midified critical- angle technique for measuring the index of refraction of metals in the extreme ultraviolet," J. Appl. Phys. 34, 15-19 (1964).
6. R. M. A. Azzam, " Simple and direct determination of complex refractive index and thickness of unsupported or embedded thin thin films by combined reflection and transmission and ellipsometry at 45°angle of incidence," J. Opt. Soc. Am. 73, 1080-1082 (1983).
7. S. F. Noe, and H. E. Bennett, "Accurate null polarimetry for measuring the refractive index of transparent materials," J. Opt. Soc. Am. A 10, 2076-2083 (1993).
8. R. P. Shukla, G. M. Perera, M C. George, and P. Venkateswarlu, "Measurement of birefringence of optical materials using a wedged plate interferometer," Opt. Commun. 78, 7-12 (1990).
9. M. H. Chiu, C. D. Chen, and D. C. Su, "Method for determining the fast axis and phase retardation of a wave plate," J. Opt. Soc.Am. A 13, 1924-1929 (1996).
10. Y. C. Huang, C. Chou, and M. Chang, "Direct measurement of refractive indices of a linear birefringent retardation plate," Opt. Commun. 133, 11-16 (1997).
11. 2.," J. Opt. Soc. Am. A 13, 875-883 (1996).
12. 4 by generalized ellipsometry," Phys. Rev. B 57, 7037-7042 (1998).
13. 2)," Opt. Lett. 22, 1808-1810 (1997).
14. G. E. Jellison, Jr, and F. A. Modine, "Two-modulator generalized ellipsometry: theory," Appl. Opt. 36, 8190-8198 (1997).
15. G. E. Jellison, Jr, and F. A. Modine, "Two-modulator generalized ellipsometry: experiment and calibration," Appl. Opt. 36, 8184-8189 (1997).
16. J. Y. Lee and D. C. Su, "A method for measuring Brewster's angle by circularly polarized heterodyne interferometry," J. Opt. 29, 349-353 (1998).
17. 2 648339 Data Sheets.
18. M. H. Chiu, J. Y. Lee, and D. C. Su, "Complex refractive-index measurement based on Fresnel's equations and the uses of heterodyne interferometry," Appl. Opt. 38, 4047-4052 (1999).
19. E. D. Palik, ed., Handbook of Optical Constants of Solids III(Academic, New York, 1998), P. 708.
20. E. D. Palik, ed., Handbook of Optical Constants of Solids III (Academic, New York, 1998), P. 729.