Josephson fluxon flow and phase diffusion in thin-film intrinsic Josephson junctions

Journal of Applied Physics

Volumn 95, Issue 9, 2004, Pages 4941-4948

  Warburton, P A ^a   Kuzhakhmetov, A R ^a   Chana, O S ^b   Burnell, G ^c   Blamire, M G ^c   Schneidewind, H ^d   Koval, Y ^e   Franz, A ^e   Muller P ^e   Hyland, D M C ^f   Dew Hughes, D ^f   Wu, H ^f   Grovenor, C R M ^f  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b KING'S COLLEGE LONDON   (United Kingdom)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^d LEIBNIZ INSTITUTE OF PHOTONIC TECHNOLOGY   (Germany)

^e UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^f UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER OXIDES; CRYSTAL DEFECTS; CRYSTAL LATTICES; CURRENT VOLTAGE CHARACTERISTICS; DIFFUSION; DRAG; ELECTRIC CURRENTS; ETCHING; EVAPORATION; MAGNETIC FIELD EFFECTS; THIN FILMS; TRANSPORT PROPERTIES; VORTEX FLOW;

COULOMB INTERACTIONS; FLUXON FLOW; JOSEPHSON PENETRATION DEPTH; PHASE DIFFUSION;

JOSEPHSON JUNCTION DEVICES;

EID: 2442695656     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1689754     Document Type: Article

References (23)

1. R. Kleiner, F. Steinmeyer, G. Kunkel, and P. Mueller, Phys. Rev. Lett. 68, 2394 (1992).
2. A. A. Yurgens, Semicond. Sci. Technol. 13, R85 (2000).
3. H. B. Wang, P. H. Wu, and T. Yamashita, Phys. Rev. Lett. 87, 107002 (2001).
4. S. J. Kim, Y. I. Latyshev, and T. Yamashita, Appl. Phys. Lett. 74, 1156 (1999).
5. N. Mros, V. M. Krasnov, A. Yurgens, D. Winkler, and T. Claeson, Phys. Rev. B 57, R8135 (1998).
6. T. van Duzer and C. W. Turner, Principles of Superconductive Devices and Circuits, 2nd ed. (Elsevier, New York, 1999).
7. R. Kleiner and P. Müller, Phys. Rev. B 49, 1327 (1994).
8. A. Irie, S. Heim, S. Schromm, M. Moessle, T. Nachtrab, M. Godo, R. Kleiner, P. Mueller, and G. Oya, Phys. Rev. B 62, 6681 (2000).
9. Y. I. Latyshev, S. J. Kim, V. N. Pavlenko, T. Yamashita, and L. N. Bulaevskii, Physica C 362, 156 (2001).
10. Y. I. Latyshev, A. E. Koshelev, V. N. Pavlenko, M. B. Gaifullin, T. Yamashita, and Y. Matsuda, Physica C 367, 365 (2002).
11. P. A. Warburton, O. S. Chana, A. R. Kuzhakhmetov, D. M. C. Hyland, C. R. M. Grovenor, D. Dew-Hughes, and P. Müller, IEEE Trans. Appl. Supercond. 11, 300 (2001).
12. P. A. Warburton, A. R. Kuzhakhmetov, G. Burnell, M. G. Blamire, and H. Schneidewind, Phys. Rev. B 67, 184513 (2003).
13. O. S. Chana, A. R. Kuzhakhmetov, D. M. C. Hyland, C. J. Eastell, D. Dew-Hughes, C. R. M. Grovenor, Y. Koval, M. Moessle, R. Kleiner, P. Müller, and P. A. Warburton, IEEE Trans. Appl. Supercond. 11, 2711 (2001).
14. K. Schlenga, R. Kleiner, G. Hechtfischer, M. Moessle, S. Schmitt, P. Mueller, C. Helm, C. Preis, F. Forsthofer, J. Keller, H. L. Johnson, M. Veith, and E. Steinbeiss, Phys. Rev. B 57, 14518 (1998).
15. T. A. Fulton and L. N. Dunkleberger, Phys. Rev. B 9, 4760 (1974).
16. V. M. Krasnov, N. Mros, A. Yurgens, D. Winkler, and T. Claeson, Appl. Supercond. 6, 777 (1998).
17. P. A. Warburton, A. R. Kuzhakhmetov, O. S. Chana, D. M. C. Hyland, C. R. M. Grovenor, G. Burnell, M. G. Blamire, and H. Schneidewind, Physica C 372-376, 322 (2002).
18. V. Ambegaokar and A. Baratoff, Phys. Rev. 11, 486 (1963).
19. P. Muller, Festkoerperprobleme 34, 1 (1995).
20. A. Franz, Y. Koval, D. Vasyukov, P. Muller, H. Schneidewind, D. A. Ryndyk, J. Keller, and C. Helm, Phys. Rev. B 69, 014506 (2004).
21. Y. M. Ivanchenko and L. A. Zil'berman, Sov. Phys. JETP 28, 1272 (1969).
22. Except for larger IJJs in low field, in which case the discontinuous jump to the quasiparticle branch occurs at voltages less than 5 μV. In this case the critical current is defined as the current at which this jump occurs.
23. Except for the bridge of width 2.6 μm at fields less than 1.4 T, where the resistance is zero for all currents up to the switching current.