On data depth and distribution-free discriminant analysis using separating surfaces

Bernoulli

Volumn 11, Issue 1, 2005, Pages 1-27

  Ghosh, Anil K ^a   Chaudhuri, Probal ^a  

^a INDIAN STATISTICAL INSTITUTE   (India)

Author keywords

Bayes risk; Elliptic symmetry; Generalized U statistic; Half space depth; Linear discriminant analysis; Location shift models; Misclassification rates; Optimal Bayes classifier; Quadratic discriminant analysis; Regression depth; Robustness

Indexed keywords

EID: 28844439821     PISSN: 13507265     EISSN: None     Source Type: Journal    
DOI: 10.3150/bj/1110228239     Document Type: Article

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