Bivariate location depth

Journal of the Royal Statistical Society. Series C: Applied Statistics

Volumn 45, Issue 4, 1996, Pages 516-523

  Rousseeuw, Peter J ^a   Ruts, Ida ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Bivariate sign tests; Data triangles; Half space depth; Simplicial depth

Indexed keywords

EID: 0040199423     PISSN: 00359254     EISSN: None     Source Type: Journal    
DOI: 10.2307/2986073     Document Type: Article

References (20)

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