Cycle time prediction and control based on production line status and manufacturing data mining

IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings

Volumn , Issue , 2005, Pages 327-330

  Chien, Chen Fu ^a,b,c   Hsiao, Chih Wei ^a,c   Meng, Cheng ^b   Hong, Kuo Tong ^b   Wang, Szu Tsung ^b  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY   (Taiwan)

^c NTHU   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CYCLE TIME; PRODUCTION PLANNING; WORK IN PROGRESS (WIP);

ALGORITHMS; MATHEMATICAL MODELS; PRODUCTION CONTROL; THROUGHPUT;

DATA MINING;

EID: 28744452107     PISSN: 1523553X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. C.F. Chien and C.H. Chen, "Using GA and CTPN for Modeling the Optimization-based Schedule Generator of a Generic Production Scheduling System," International Journal of Production Research.
2. D.J. Miller, "Simulation of a semiconductor manufacturing line," Communications of the ACM, vol. 33, pp. 98-108, October 1990.
3. C.F. Chien, Y.C. Shih, C.M. Lin and J. Chen, Semiconductor Manufacturing Technology & Management, Tsing Hua University Press, 2005.
4. C. Peng and C.F. Chien, "Data Value Development to Enhance Yield and Maintain Competitive Advantage for Semiconductor Manufacturing", International Journal of Service Technology and Management, vol. 4, no. 4-6, pp. 365-383, 2003.
5. M. Gardner and J. Bieker, "Data mining solves tough semiconductor manufacturing problems," presented at the Conference on Knowledge Discovery in Data, Boston, United States, 2000.
6. C.F. Chien, A. Hsiao and E. Wang, "Constructing semiconductor manufacturing performance indexs and applying data mining for manufacturing data analysis," Journal of Chinese Institute of Industrial Engineers, vol. 21, pp. 313-327, 2004.