Estimating DPPM during the prototype to product ramp phase

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2005, Pages 682-683

  Anderson, Thomas J ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

Acceleration; Burn In; De rating; DPPM; Early failure rate; Op life; Weibull

Indexed keywords

FAILURE DISTRIBUTION; PROCESS ITERATION;

ESTIMATION;

PULSE POSITION MODULATION;

EID: 28744444175     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. JEDEC Standard No. 74, "Early Failure Rate Calculation Procedure for Electronic Components."
2. P. A. Tobias and D. C. Trindade, "Applied Reliability," Second Ed., Chapman & Hall/CRC, 1995.
3. D. B. Kececioglu and F. Sun, "Burn In Testing: Its Quantification and Optimization," Prentice-Hall, 1997.
4. K. R. Forbes and P. Schani, "Characterization of the Time-Dependent Reliability Fallout as a Function of Yield for a 130nM SRAM Device and Application to Optimize Production Bum In,", International Reliability Physics Symposium, 2004, pp. 165-170.
5. W. Weibull, "A Statistical Distribution Function of Wide Applicability," Journal of Applied Mechanics, 1951, pp. 293-297.
6. E. L. Kaplan and P. Meier, Journal of the American. Statistical Association, 53, 1958, pp. 457-481.
7. C. Glen Shirley, "A Defect Model of Reliability," Tutorial 3 of the International Reliability Physics Symposium, 1996.