Mechanism of On-current and Off-current Instabilities under electrical stress in polycrystalline silicon thin-film transistors

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2005, Pages 702-703

  De Wang, Shen ^a   Chang, Tzu Yun ^a   Lo, Wei Hsiang ^a   Lei, Tan Fu ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Electrical stress; Instabilities; Off current (Ioff); On current (Ion); Poly Si TFTs

Indexed keywords

ELECTRICAL STRESS; INSTABILITIES; OFF CURRENT (IOFF); ON CURRENT (ION); POLY SI TFTS;

ELECTRIC CURRENTS; ELECTRIC POTENTIAL; MATHEMATICAL MODELS; POLYSILICON;

THIN FILM TRANSISTORS;

EID: 28744435956     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

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2. K. R. Olasupo et al., IEEE Trans. on Electron Devices, vol. 43, no. 8, p.1218, 1996.
3. I-Wei Wu et al, IEEE Electron Devices Letters, vol. 11, no.4, p. 167, 1990.