Low distortion reflection electron microscopy for surface studies

Surface Science

Volumn 599, Issue 1-3, 2005, Pages 187-195

  Muller P ^a   Metois J J ^a  

^a AIX MARSEILLE UNIVERSITY   (France)

Author keywords

2D islands; Dislocations and surface atomic steps; Growth or evaporation spiral; Reflection electron microscopy; Silicon surfaces; Surface structure, morphology and roughness

Indexed keywords

DISLOCATIONS (CRYSTALS); ELECTRON REFLECTION; EVAPORATION; GROWTH KINETICS; MORPHOLOGY; SILICON; SURFACE CHEMISTRY; SURFACE ROUGHNESS; SURFACE STRUCTURE; TWO DIMENSIONAL;

2D ISLANDS; DISLOCATIONS AND SURFACE ATOMIC STEPS; GROWTH OR EVAPORATION SPIRAL; REFLECTION ELECTRON MICROSCOPY (REM); SILICON SURFACES; SURFACE STRUCTURE, MORPHOLOGY, AND ROUGHNESS;

ELECTRON MICROSCOPY;

EID: 28544438456     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.09.047     Document Type: Article

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