Preferential amorphisation of Ge nanocrystals in a silica matrix

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 242, Issue 1-2, 2006, Pages 121-124

  Ridgway, M C ^a   Azevedo, G D M ^a,d   Elliman, R G ^a   Wesch, W ^a,e   Glover, C J ^a,f   Miller, R ^a,g   Llewellyn, D J ^a   Foran, G J ^b   Hansen, J L ^c   Larsen, A Nylandsted ^c  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^c AARHUS UNIVERSITY   (Denmark)

^d LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

^e FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^f AUSTRALIAN SYNCHROTRON   (Australia)

^g UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

Amorphisation; EXAFS; Ion irradiation; Nanocrystals; Raman

Indexed keywords

AMORPHIZATION; GERMANIUM COMPOUNDS; ION BEAMS; IRRADIATION; PHASE TRANSITIONS; RAMAN SPECTROSCOPY; SILICA; SINGLE CRYSTALS;

EXAFS; ION IRRADIATION; NANOCRYSTALS;

NANOSTRUCTURED MATERIALS;

EID: 28544434978     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.08.024     Document Type: Conference Paper

References (4)

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2. A. Cheung, G. de M. Azevedo, C.J. Glover, D.J. Llewellyn, R.G. Elliman, G.J. Foran, and M.C. Ridgway Appl. Phys. Lett. 84 2004 278
3. W.K. Choi, V. Ng, S.P. Ng, H.H. Thio, Z.X. Shen, and W.S. Li J. Appl. Phys. 86 1999 1398
4. J.F. Ziegler. Available from: .