Analysis and simulation of noise in correlated double sampling imager circuits

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5844, Issue , 2005, Pages 238-247

  Forbes, Leonard ^a   Gopalakrishnan, Harish ^a   Wanalertlak, Weetit ^a  

^a Oregon State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

1/F NOISE;

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION;

THERMAL NOISE;

EID: 28444465157     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.608761     Document Type: Conference Paper

References (5)

1. K. Findlater, R, Henderson, D. Baxter, J.E.D. Hurwitz, L. Grant, "SXGA Pinned Photodiode CMOS Image Sensor in 0.35μm Technology," Abst. IEEE Solid-State Circuits Conference, pp. 218-219, San Francisco, Feb. 2003.
2. R.J. Kansy, "Response of a Correlated Double Sampling Circuit to 1/f Noise," IEEE Journal of Solid-State Circuits, vol. sc-15, no. 3, pp. 373-375, 1980.
3. Design Systems Inc., "Affirma RF Simulator (Spectre RF) User Guide", v. 4.4.5, 1999.
4. K. Kundert, "Simulating Switched-Capacitor Filters with SpectreRF," v.4a, 13 Nov. 2003, http://www.designers-guide.com/Analysis/sc- filters.pdf
5. C.W. Zhang, M.Y. Louie and L. Forbes, "MOSFET 1/f Noise Measurement under Switched Bias Conditions", IEEE Workshop on Microelectronics and Electron Devices, , pp. 79-81, Boise, Idaho, 16 Apr. 2004.