Challenges in the surface analytical characterisation of anodic TiO 2 films - A review

Zeitschrift fur Physikalische Chemie

Volumn 219, Issue 11, 2005, Pages 1561-1582

  Kunze, Julia ^a   Ghicov, Andrei ^a   Hildebrand, Helga ^a   Macak, Jan M ^a   Traveira, Luciano ^a   Schmuki, Patrik ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

AES; Anodic Oxide on Titanium; Sputter Effects; Surface Morphology; XPS

Indexed keywords

ANODIC OXIDATION; OXIDE FILMS; OXIDE MINERALS; SURFACE MORPHOLOGY; TITANIUM DIOXIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

ANODIC OXIDES; CRYSTALLOGRAPHIC ORIENTATIONS; NANOTUBE STRUCTURE; POLYCRYSTALLINE SURFACE; PRIMARY ELECTRON BEAMS; SPUTTER DEPTH PROFILES; SUBSTRATE CONDITIONS; SURFACE ANALYTICAL METHODS;

MORPHOLOGY;

EID: 28444461861     PISSN: 09429352     EISSN: None     Source Type: Journal    
DOI: 10.1524/zpch.2005.219.11.1561     Document Type: Article

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