The dependence of the optical property of Ti anodic oxide film on its growth rate by ellipsometry

Corrosion Science

Volumn 39, Issue 7, 1997, Pages 1253-1263

  Ohtsuka, T ^a   Nomura, N ^a  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

A. titanium; B. ellipsometry; B. potentiostatic; C. anodic films; C. passive films

Indexed keywords

DEHYDRATION; ELLIPSOMETRY; FILM GROWTH; REFRACTIVE INDEX; SULFURIC ACID; TITANIUM OXIDES;

POTENTIAL SWEEP RATE;

OPTICAL FILMS;

EID: 0031187626     PISSN: 0010938X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0010-938X(97)00025-5     Document Type: Article

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