Thermoelectric properties of bismuth telluride thin films deposited by radio frequency magnetron sputtering

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5836, Issue , 2005, Pages 711-718

  Tan, J ^a   Kalantar Zadeh, K ^a   Wlodarski, W ^a   Bhargava, S ^a   Akolekar, D ^a   Holland, A ^a   Rosengarten, G ^a  

^a RMIT UNIVERSITY   (Australia)

Author keywords

Bi2Te3; Bismuth Telluride; Seebeck coefficient; Thermoelectric

Indexed keywords

BISMUTH COMPOUNDS; MAGNETRON SPUTTERING; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; THERMOELECTRICITY; X RAY DIFFRACTION ANALYSIS;

BI2TE3; BISMUTH TELLURIDE; SEEBECK COEFFICIENT; THERMOELECTRIC;

THIN FILMS;

EID: 28344437089     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.609819     Document Type: Conference Paper

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