Inspection of magnetic semiconductor and clustering structure in CoFe-doped ZnO films by bias-dependent impedance spectroscopy

Applied Physics Letters

Volumn 87, Issue 13, 2005, Pages 1-3

  Huang, J C A ^a,b   Hsu, H S ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b NATIONAL UNIVERSITY OF KAOHSIUNG   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT COMPOUNDS; EQUIVALENT CIRCUITS; GRAIN BOUNDARIES; RELAXATION PROCESSES; SPECTROSCOPIC ANALYSIS; THIN FILMS; ZINC OXIDE;

BIAS-DEPENDENT SPECTROSCOPY; CLUSTERING; METAL CLUSTERS;

MAGNETIC SEMICONDUCTORS;

EID: 28344435954     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2058211     Document Type: Article

References (13)

1. S. J. Pearton, C. R. Abernathy, D. P. Norton, A. F. Hebard, Y. D. Park, L. A. Boatner, and J. D. Budai, Mater. Sci. Eng., R. 40, 137 (2003).
2. M. Venkatesan, C. B. Fitzgerald, J. G. Lunney, and J. M. D. Coey, Phys. Rev. Lett. 93, 177206 (2004).
3. S. Ramachandran, Ashutosh Tiwari, and J. Narayan, Appl. Phys. Lett. 84, 5255 (2004).
4. S. A. Chambers, T. Droubay, C. M. Wang, A. S. Lea, R. F. C. Farrow, L. Folks, V. Deline, and S. Anders, Appl. Phys. Lett. 82, 1257 (2003).
5. J. H. Park, M. G. Kim, H. M. Jang, S. Ryu, and Y. M. Kim, Appl. Phys. Lett. 84, 1338 (2004).
6. J. C. A. Huang, H. S. Hsu, Y. M. Hu, C. H. Lee, Y. H. Huang, and M. Z. Lin, Appl. Phys. Lett. 85, 3815 (2004).
7. R. J. Kennedy, P. A. Stampe, E. Hu, P. Xiong, S. V. Molnár, and Y. Xin, Appl. Phys. Lett. 84, 2832 (2004).
8. A. Punnoose, M. S. Seehra, W. K. Park, and J. S. Moodera, J. Appl. Phys. 93, 7867 (2003).
9. A. K. Jonscher, Nature (London) 264, 673 (1977).
10. A. Pelaiz-Barranco, M. P. Gutierrez-Amador, A. Huanosta, and R. Valenzuela, Appl. Phys. Lett. 73, 2039 (1998).
11. J. C. A. Huang and C. Y. Hsu, Appl. Phys. Lett. 85, 5947 (2004).
12. A. K. Jonscher, Dielectric Relaxation in Solids (Chelaea Dielectrics, London, 1983), p. 85.
13. J. R. Macdonald, Impedance Spectroscopy Emphasizing Solid Materials and Systems (Wiley, New York, 1987), Chap..