TEMPOS structures with gold nanoclusters

Radiation Effects and Defects in Solids

Volumn 159, Issue 8-9, 2004, Pages 517-533

  Sinha, D ^a,b   Petrov, A ^a,c   Fink, D ^a   Fahrner, W R ^d   Hoppe, K ^e   Chandra, A ^a,f  

^a HAHN MEITNER INSTITUT   (Germany)

^b NAGALAND UNIVERSITY   (India)

^c INSTITUTE OF SOLID STATE AND SEMICONDUCTOR PHYSICS   (Belarus)

^d UNIVERSITY OF HAGEN   (Germany)

^e South Westfalla University of Applied Sciences   (Germany)

^f PANJAB UNIVERSITY   (India)

Author keywords

Au nanoclusters; Current voltage characteristics; Scanning electron microscopy; TEMPOS structures

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ETCHING; IONS; MOS DEVICES; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DEVICES;

AU NANOCLUSTERS; CURRENT/VOLTAGE CHARACTERISTICS; ION TRACKS; TEMPOS STRUCTURES;

GOLD;

EID: 28244495139     PISSN: 10420150     EISSN: 10294953     Source Type: Journal    
DOI: 10.1080/10420150412331304187     Document Type: Article

References (6)

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