3D Simulation study of gate coupling and gate cross-interference in advanced floating gate non-volatile memories

Solid-State Electronics

Volumn 49, Issue 11 SPEC. ISS., 2005, Pages 1805-1812

  Ghetti, Andrea ^a   Bortesi, Luca ^a   Vendrame, Loris ^a  

^a STMICROELECTRONICS   (Italy)

Author keywords

3D Simulation; Floating gate; Gate coupling; Gate interference; Non volatile memories

Indexed keywords

COMPUTER ARCHITECTURE; COMPUTER SIMULATION; GATES (TRANSISTOR);

3D SIMULATION; FLOATING GATES; GATE COUPLINGS; GATE INTERFERENCE; NON-VOLATILE MEMORIES;

NONVOLATILE STORAGE;

EID: 28044473172     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2005.10.014     Document Type: Article

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