Using line segments as structuring elements for sampling-invariant measurements

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 27, Issue 11, 2005, Pages 1826-1831

  Luengo Hendriks, C L ^a   van Vliet, L J ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Granulometry; Mathematical morphology; Rotation invariance; Translation invariance

Indexed keywords

APPROXIMATION THEORY; INTERPOLATION; MATHEMATICAL MODELS; MATHEMATICAL MORPHOLOGY; RANDOM PROCESSES;

GRANULOMETRY; ROTATION INVARIANCE; TRANSLATION INVARIANCE;

IMAGE SEGMENTATION;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; COMPUTER ASSISTED DIAGNOSIS; IMAGE ENHANCEMENT; INFORMATION RETRIEVAL; METHODOLOGY; SAMPLE SIZE; SIGNAL PROCESSING;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; INFORMATION STORAGE AND RETRIEVAL; PATTERN RECOGNITION, AUTOMATED; SAMPLE SIZE; SIGNAL PROCESSING, COMPUTER-ASSISTED;

EID: 28044455885     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2005.228     Document Type: Article

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