Performance of optimal registration estimators

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5817, Issue , 2005, Pages 133-144

  Pham, Tuan Q ^a   Bezuijen, Marijn ^a   Van Vliet, Lucas J ^a   Schutte, Klamer ^b   Luengo Hendriks, Cris L ^c  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b TNO   (Netherlands)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Cramer Rao bound; Optimal registration; Registration bias; Registration limit; Super resolution

Indexed keywords

OPTICAL RESOLVING POWER; PERFORMANCE; SIGNAL THEORY;

CRAMER-RAO BOUND; OPTIMAL REGISTRATION; REGISTRATION BIAS; REGISTRATION LIMIT; SUPER-RESOLUTION;

IMAGE PROCESSING;

EID: 24944525839     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.603304     Document Type: Conference Paper

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