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Volumn 6, Issue 5, 2005, Pages 499-507

Influence of microstructure on fatieue crack growth resistance in TiAl alloys by using white light image correlation method;Étude du rôle de la microstructure sur la résistance à la fissuration par fatigue des alliages TiAI à l'aide de la technique de corrélation d'images numériques de mouchetis

Author keywords

Correlation; Crack propagation; Fatigue; Strain; TiAl alloys

Indexed keywords

CRACK-GROWTH RESISTANCE; DIGITAL IMAGE CORRELATIONS; FATIGUE CRACK PROPAGATION RESISTANCE; IN-PLANE STRAINS; LAMELLAR MICROSTRUCTURE; OPTICAL METHODS; PROPAGATION MECHANISM; TIAL ALLOY;

EID: 27944503480     PISSN: 12962139     EISSN: None     Source Type: Journal    
DOI: 10.1051/meca:2005062     Document Type: Article
Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.