Investigation of the surface passivation quality of various novel low temperature rear localized contacting schemes for photovoltaic devices

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2005, Pages 1189-1192

  Ho, Anita W Y ^a   Wenham, Stuart R ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; EPITAXIAL GROWTH; PASSIVATION; PHOTOCONDUCTIVITY; PHOTOLITHOGRAPHY;

ALUMINUM SPIKING; PHOTOVOLTAIC DEVICES;

PHOTOVOLTAIC EFFECTS;

EID: 27944493660     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

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2. S.R. Wenham et.al., Prog. Photovolt: Res. Appl. 5, 1997, pp. 131-137.
3. J. Zhao, A. Wang & M.A. Green, Prog. Photovolt: Res. Appl. 7, 1999, pp. 471-474.
4. A. Bierhals et.al., J. Appl. Phys. 83 (3) 1998, pp. 1371-1378.
5. R.B. Godfrey, M.A. Green, Appl. Phys. Lett. 34 (12) 1979, pp. 860-861.
6. A.W.Y. Ho & S.R. Wenham, Prog. Photovolt: Res. Appl. 12, 2004, pp. 297-308.