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Volumn , Issue , 2005, Pages 1335-1338

Crystalline silicon short-circuit current degradation study: Initial results

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE SILICON SHORT-CIRCUIT CURRENT DEGRADATION; SLOW DEGRADATION;

EID: 27944489636     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (14)

References (6)
  • 4
    • 0033873060 scopus 로고    scopus 로고
    • Photothermal stability of encapsulated Si solar cells and encapsulation materials upon accelerated exposures
    • F.J. Pern and S.H. Glick, "Photothermal Stability of Encapsulated Si Solar Cells and Encapsulation Materials Upon Accelerated Exposures," Solar Energy Materials & Solar Cells, 61 (2000), pp. 153-188.
    • (2000) Solar Energy Materials & Solar Cells , vol.61 , pp. 153-188
    • Pern, F.J.1    Glick, S.H.2
  • 5
    • 77952637896 scopus 로고    scopus 로고
    • Standard test method for electrical performance of photovoltaic cells using reference cells under simulated sunlight
    • ASTM International Standard E 948, Vol. 12.02
    • ASTM International Standard E 948, "Standard Test Method for Electrical Performance of Photovoltaic Cells Using Reference Cells Under Simulated Sunlight," Annual Book of ASTM Standards, Vol. 12.02, 2004.
    • (2004) Annual Book of ASTM Standards


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.