Crystalline silicon short-circuit current degradation study: Initial results

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2005, Pages 1335-1338

  Osterwald, C R ^a   Pruett, J ^a   Moriarty, T ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE SILICON SHORT-CIRCUIT CURRENT DEGRADATION; SLOW DEGRADATION;

CELLS; SHORT CIRCUIT CURRENTS; SILICON; THIN FILMS; WSI CIRCUITS;

CRYSTALLINE MATERIALS;

EID: 27944489636     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. C.R. Osterwald, J.P. Benner, J. Pruett, A. Anderberg, S. Rummel, and L. Ottoson, "Degradation in Weathered Crystalline-Silicon PV Modules Apparently Caused by UV Radiation," Proc. 3rd World Conf. on PV Energy Conversion, Osaka, Japan, 2003, ISBN 4-9901819-3-8.
2. C.R. Osterwald, A. Anderberg, S. Rummel, and L. Ottoson, "Degradation Analysis of Weathered Crystalline-Silicon PV Modules," Proc. 29th IEEE PV Spec. Conf., Piscataway, NJ, 2002, pp. 1392-1395.
3. C.R. Osterwald, J. Pruett, D.R. Myers, S. Rummel, A. Anderberg, L. Ottoson, and T. Basso, "Real-Time and Acclerated Solar Weathering of Commercial PV Modules," Proc. 2001 NCPV Prog. Rev. Meeting, NREL, Golden, CO, 2001, p. 309.
4. F.J. Pern and S.H. Glick, "Photothermal Stability of Encapsulated Si Solar Cells and Encapsulation Materials Upon Accelerated Exposures," Solar Energy Materials & Solar Cells, 61 (2000), pp. 153-188.
5. ASTM International Standard E 948, "Standard Test Method for Electrical Performance of Photovoltaic Cells Using Reference Cells Under Simulated Sunlight," Annual Book of ASTM Standards, Vol. 12.02, 2004.
6. T. Saitoh, H. Hasigami, S. Rein, and S. Glunz, "Overview of Light Degradation Research on Crystalline Silicon Solar Cells," Prog. in PV: Research and Applications, 8, 537 (2000)