Noise in secondary electron emission: The low yield case

Journal of Electron Microscopy

Volumn 54, Issue 4, 2005, Pages 361-365

  Frank, Luďk ^a  

^a INSTITUTE OF SCIENTIFIC INSTRUMENTS   (Czech Republic)

Author keywords

Noise; Non Poisson factor; Secondary electrons; Secondary emission noise; SEM image noise; Statistics of secondary electrons

Indexed keywords

CHEMICAL ELEMENTS; ELECTRONS; SCANNING ELECTRON MICROSCOPY;

IMAGE NOISE; NOISE; NON-POISSON FACTOR; SECONDARY ELECTRON EMISSIONS; SECONDARY ELECTRONS; SECONDARY EMISSION NOISE; SEM IMAGE; SEM IMAGE NOISE; STATISTIC OF SECONDARY ELECTRON;

SECONDARY EMISSION;

EID: 27944473691     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfi044     Document Type: Article

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