Excess dark currents and transients in thin-film CdTe solar cells: Implications for cell stability and encapsulation of scribe lines and cell ends in modules

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2005, Pages 363-366

  McMahon, T J ^a   Berniard, T J ^a   Albin, D S ^a   Demtsu, S H ^b  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b Department of Environmental and Radiological Health Sciences   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT TRANSIENTS; ENVIRONMENTAL STRESS; SHUNT RESISTANCE;

CADMIUM COMPOUNDS; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; FAILURE (MECHANICAL); INFRARED RADIATION; TRANSIENTS;

SOLAR CELLS;

EID: 27944456910     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. T.J. McMahon, T.J. Berniard and D.S. Albin, "Non-linear shunt paths in thin-film CdTe solar cells," to be published in Feb 15, 2005 issue of J. Appl. Phys.
2. D.S. Albin et al., this volume.
3. V.G. Karpov, A.D. Compaan, and D. Shvdka, "Effects of nonuniformity in thin-film photovoltaics," Appl. Phys. Lett. 80, (2002) pp. 4256.
4. T.J. McMahon, "Dark current transients in thin-film CdTe solar cells," Proc. of the 29th IEEE Photovoltaic Specialists Conf., May 2002, New Orleans, LA., pp. 768-771
5. T.J. McMahon and M.S. Bennett, "Metastable shunt paths in a-Si solar cells," Solar Energy Materials and Solar Cells, 41/42 (1996) pp. 465.
6. D. Rose, D.F. Hasoon, R. Dhere, D. Albin, R. Ribelin, X Li, Y. Mahathongdy, T. Gessert, and P. Sheldon. "Fabrication procedures and process sensitivities for CdS/CdTe solar cells," Progress in Photovoltaics: Research and Applications 1999; 7: pp. 331-340.
7. S.J. Krumbein, "Tutorial: Electrolytic models for metallic electromigration failure mechanisms," IEEE Trans. on Reliability, 44 no. 4, (1995) pp. 539-549.