Characterization of a LiCoO2 thin film cathode grown by pulsed laser deposition

Philosophical Magazine

Volumn 85, Issue 24, 2005, Pages 2831-2842

  Tang, S B ^a   Lu, L ^a   Lai, M O ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CRYSTALLINE MATERIALS; CYCLIC VOLTAMMETRY; IMPURITIES; LITHIUM COMPOUNDS; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; STAINLESS STEEL; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

CAPACITY LOSS; CHEMICAL DIFFUSION COEFFICIENTS; THIN FILM CATHODE;

CATHODES;

EID: 27844554460     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430500156435     Document Type: Article

References (33)

1. P. Fragnaut, T. Brousse and D.M. Schleich, J. Power Sources 63 187 (1996).
2. E. Antolini, Solid State Ionics 170 159 (2004).
3. D. Aurbach, B. Marcovsky, A. Rodikin, et al., Electrochim. Acta 47 4291 (2002).
4. C.M. Julien, Mater. Sci. Eng. R40 47 (2003).
5. J.B. Bates, N.J. Dudney, B. Neudecker, et al., Solid State Ionics 135 33 (2002).
6. N.J. Dudney and Y.I. Jang, J. Power Sources 119-121 300 (2003).
7. S.I. Cho and S.G. Yoon, J. Electrochem. Soc. 149 A1584 (2002).
8. C.N. Polo da Fonseca, J. Davalos, M. Kleinlke, et al., J. Power Sources 81/82 575 (1999).
9. C.-L. Liao and K.-Z. Fung, J. Power Sources 128 263 (2004).
10. W.-S. Kim, J. Power Sources 134 103 (2004).
11. K.A. Striebel, C.Z. Deng, S.J. Wen, et al., J. Electrochem. Soc. 143 1821 (1996).
12. J.D. Perkins, C.S. Bahn, P.A. Parilla, et al., J. Power Sources 81/82 675 (1999).
13. J.D. Perkins, C.S. Bahn, J.M. McGraw, et al., J. Electrochem. Soc. 148 A1302 (2001).
14. C. Julien and S. Gastro-Garcia, J. Power Sources 97/98 290 (2001).
15. Y.H. Rho and K. Kanamura, J. Electrochem. Soc. 151 A1406 (2004).
16. K.W. Kim, S.I. Woo, K.-H. Choi, et al., Solid State Ionics 159 25 (2003).
17. P.J. Bouwman, B.A. Boukamp, H.J.M. Bouwmeester, et al., J. Electrochem. Soc. 149 A699 (2002).
18. J.B. Bates, N.J. Dudney, B.J. Neudecker, et al., J. Electrochem. Soc. 147 59 (2000).
19. Y. Iriyama, M. Inaba, T. Abe, et al., J. Power Sources 94 175 (2001).
20. J.N. Reimers and J.R. Dahn, J. Electrochem. Soc. 139 2091 (1992).
21. M. Inaba, Y. Iriyama, Z. Ogumi, et al., J. Raman Spectrosc. 28 613 (1997).
22. W. Huang and R. French, Solid State Ionics 86-88 395 (1996).
23. C. Julien, E. Haro-Poniatowski, M.A. Camacho-Lopez, et al., Mater. Sci. Eng. B 72 36 (2000).
24. G.G. Amatucci, J.M. Tarascon and L.C. Clein, J. Electrochem. Soc. 143 1114 (1996).
25. J.M. Paulson, J.R. Mueller-Neuhaus and J.R. Dahn, J. Electrochem. Soc. 147 508 (2000).
26. M.D. Levi, G. Salitra, B. Markovsky, et al., J. Electrochem. Soc. 146 1279 (1999).
27. Y. Jang, B.J. Neudecker and N.J. Dudney, Electrochem. Solid State Lett. 4 A74 (2001).
28. J.M. McGraw, C.S. Bahn, P.A. Parilla, et al., Electrochim. Acta 45 187 (1999).
29. Y.H. Rho and K. Kanamura, J. Electrochem. Soc. 151 A1406 (2004).
30. T. Ohzuku and A. Ueda, J. Electrochem. Soc. 141 2972 (1994).
31. G.G. Ameaucci, J.M. Tarascon and L.C. Klein, J. Electrochem. Soc. 143 1114 (1996).
32. J. Mokenda, A. Stoklosa and T. Bak, Solid State Ionics 36 53 (1989).
33. J.C. Dupin, D. Gonbeau, I. Martin-Litas, et al., J. Electron Spectrosc. 120 55 (2001).