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Volumn 55, Issue 10, 2005, Pages 1261-1274
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The study of electronic conduction in amorphous thin films of Al-In 2O3-Al structure deposited by thermal evaporation
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Author keywords
Carrier density; Electrical conduction mechanisms; Electron donors; Indium interstitials; Lower oxidation state; Oxygen vacancies; Trapped electrons
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Indexed keywords
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EID: 27844476816
PISSN: 00114626
EISSN: None
Source Type: Journal
DOI: 10.1007/s10582-005-0133-8 Document Type: Article |
Times cited : (10)
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References (16)
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