Near-field intensity correlations in semicontinuous metal-dielectric films

Physical Review Letters

Volumn 94, Issue 22, 2005, Pages

  Seal, K ^a   Sarychev, A K ^b   Noh, H ^a   Genov, D A ^c   Yamilov, A ^a   Shalaev, V M ^c   Ying, Z C ^d   Cao, H ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

^b Ethertronics Inc   (United States)

^c PURDUE UNIVERSITY   (United States)

^d NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

METAL PARTICLES; METAL-DIELECTRIC FILMS; NEAR-FIELD INTENSITY CORRELATIONS;

NEAR FIELD SCANNING OPTICAL MICROSCOPY; PARTICLES (PARTICULATE MATTER); SURFACE PROPERTIES; SURFACE WAVES; WAVE PROPAGATION;

DIELECTRIC FILMS;

EID: 27744601251     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.94.226101     Document Type: Article

References (23)

1. The Scattering and Localization of Classical Waves, edited by, P. Sheng, (World Scientific, Singapore, 1990).
2. R. Berkovits and S. Feng, Phys. Rep. 238, 135 (1994); PRPLCM 0370-1573 10.1016/0370-1573(94)90079-5
3. M.C.W. van Rossum and Th.M. Nieuwenhuizen, Rev. Mod. Phys. 71, 313 (1999). RMPHAT 0034-6861 10.1103/RevModPhys.71.313
4. P. Sebbah, Phys. Rev. Lett. 88, 123901 (2002). PRLTAO 0031-9007 10.1103/PhysRevLett.88.123901
5. A.A. Chabanov, Phys. Rev. Lett. 92, 173901 (2004). PRLTAO 0031-9007 10.1103/PhysRevLett.92.173901
6. V. Emiliani, Phys. Rev. Lett. 90, 250801 (2003). PRLTAO 0031-9007 10.1103/PhysRevLett.90.250801
7. A. Apostol and A. Dogariu, Phys. Rev. Lett. 91, 093901 (2003). PRLTAO 0031-9007 10.1103/PhysRevLett.91.093901
8. J.A. Sanchez-Gil and M. Nieto-Vesperinas, Phys. Rev. B PRBMDO 0163-1829 45, 8623 (1992). 10.1103/PhysRevB.45.8623
9. A.R. McGurn and A.A. Maradudin, Opt. Commun. 155, 79 (1998). OPCOB8 0030-4018 10.1016/S0030-4018(98)00285-5
10. V.M. Shalaev, Nonlinear Optics of Random Media (Springer, Berlin, 2000);
11. A.K. Sarychev and V.M. Shalaev, Phys. Rep. PRPLCM 0370-1573 335, 275 (2000). 10.1016/S0370-1573(99)00118-0
12. S.I. Bozhevolnyi, Phys. Rev. Lett. 89, 186801 (2002); PRLTAO 0031-9007 10.1103/PhysRevLett.89.186801
13. S.I. Bozhevolnyi, Phys. Rev. Lett. 90, 197403 (2003). PRLTAO 0031-9007 10.1103/PhysRevLett.90.197403
14. D.P. Tsai, Phys. Rev. Lett. 72, 4149 (1994); PRLTAO 0031-9007 10.1103/PhysRevLett.72.4149
15. S. Gresillon, Phys. Rev. Lett. 82, 4520 (1999). PRLTAO 0031-9007 10.1103/PhysRevLett.82.4520
16. K. Seal, Phys. Rev. B PRBMDO 0163-1829 67, 35318 (2003). 10.1103/PhysRevB.67.035318
17. Y. Yagil, Phys. Rev. B PRBMDO 0163-1829 46, 2503 (1992). 10.1103/PhysRevB.46.2503
18. A.K. Sarychev, Phys. Rev. B PRBMDO 0163-1829 51, 5366 (1995). 10.1103/PhysRevB.51.5366
19. L. Zekri, J. Phys. Condens. Matter 12, 283 (2000). JCOMEL 0953-8984 10.1088/0953-8984/12/3/307
20. R. Carminati and J. Greffet, Phys. Rev. Lett. 82, 1660 (1999). PRLTAO 0031-9007 10.1103/PhysRevLett.82.1660
21. M.L. Brongersma, Phys. Rev. B PRBMDO 0163-1829 62, R16356 (2000). 10.1103/PhysRevB.62.R16356
22. A.L. Burin, J. Opt. Soc. Am. B 21, 121 (2004). JOBPDE 0740-3224 10.1364/JOSAB.21.000121
23. M.I. Stockman, Phys. Rev. Lett. 87, 167401 (2001). PRLTAO 0031-9007 10.1103/PhysRevLett.87.167401